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US Patent Issued to LOT CES, LOT VACUUM on July 14 for "Semiconductor manufacturing facility and method of operating the same" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,132, issued on July 14, was assigned to LOT CES Co. LTD. (Osan-si, South Korea) and LOT VACUUM Co. LTD. (Osan-si, South Korea). "Semiconduc... और पढ़ें


US Patent Issued to SAMSUNG ELECTRONICS on July 14 for "Plasma processing apparatus and method of manufacturing semiconductor device" (South Korean Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,133, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Plasma processing apparatus and method of ma... और पढ़ें


US Patent Issued to Tokyo Electron on July 14 for "High-performance adaptable sampling system" (Texas Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,135, issued on July 14, was assigned to Tokyo Electron Ltd. (Tokyo). "High-performance adaptable sampling system" was invented by Charles S... और पढ़ें


US Patent Issued to Applied Materials on July 14 for "Wafer edge profile control using connected edge ring hardware" (American, Swiss, Indian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,136, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Wafer edge profile control using connected edge ring... और पढ़ें


US Patent Issued to Purdue Research Foundation on July 14 for "All-optical single-photon detector" (Indiana Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,137, issued on July 14, was assigned to Purdue Research Foundation (West Lafayette, Ind.). "All-optical single-photon detector" was invente... और पढ़ें


US Patent Issued to DH Technologies Development on July 14 for "Calibration techniques for mass spectrometry system" (Massachusetts, New Hampshire Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,138, issued on July 14, was assigned to DH Technologies Development Pte. Ltd. (Singapore). "Calibration techniques for mass spectrometry sy... और पढ़ें


US Patent Issued to DH Technologies Development on July 14 for "Systems and methods for charge state assignment in mass spectrometry" (Canadian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,139, issued on July 14, was assigned to DH Technologies Development Pte. Ltd. (Singapore). "Systems and methods for charge state assignment... और पढ़ें


US Patent Issued to Roche Diagnostics Operations on July 14 for "Target for use in a laser desorption mass spectrometer" (German Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,140, issued on July 14, was assigned to Roche Diagnostics Operations Inc. (Indianapolis). "Target for use in a laser desorption mass spectr... और पढ़ें


US Patent Issued to THERMO FINNIGAN on July 14 for "Systems and techniques for in-source ion separation" (California Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,141, issued on July 14, was assigned to THERMO FINNIGAN LLC (San Jose, Calif.). "Systems and techniques for in-source ion separation" was i... और पढ़ें


US Patent Issued to HUIZHOU EVE POWER, EVE POWER on July 14 for "Electrode thickness control method and control system" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,683,142, issued on July 14, was assigned to HUIZHOU EVE POWER Co. LTD. (Huizhou, China) and EVE POWER Co. LTD. (Jingmen, China). "Electrode thi... और पढ़ें